On Detecting Concurrency Defects Automatically at the Design Level

  • Name:

    Konferenzartikel 

  • Author:

    Frank Padberg
    Luis M. Carril
    Oliver Dendinger
    Martin Blersch

  • Zusammenfassung

    We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.
  • Year:

    2013 

  • Links:
Beteiligte Mitarbeiter (zufällige Reihenfolge)
Titel Vorname Nachname
Dipl.-Inform. Martin Blersch
Dr. Luis Manuel Carril Rodriguez
Dipl.-Inform. Oliver Denninger
Dr. Ing. Frank Padberg

Bibtex

@inproceedings{,
author={Frank Padberg, Luis M. Carril, Oliver Denninger, Martin Blersch},
title={On Detecting Concurrency Defects Automatically at the Design Level},
year=2013,
month=Dezember,
booktitle={20th Asia-Pacific Conference on Software Engineering APSEC},
url={https://ps.ipd.kit.edu/downloads/},
abstract={We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.},
}