Using Machine Learning for Estimating the Defect Content After an Inspection
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Name:
Konferenzartikel
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Author:
T. Ragg , R. Schoknecht
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Year:
2004
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Bibtex
@inproceedings{,
author={T. Ragg , R. Schoknecht},
title={Using Machine Learning for Estimating the Defect Content After an Inspection},
year=2004,
booktitle={IEEE Transactions on Software Engineering TSE},
url={https://ps.ipd.kit.edu/downloads/ka_2004_machine_learning_estimating_defect_content.pdf},
}