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Using Machine Learning for Estimating the Defect Content After an Inspection

Using Machine Learning for Estimating the Defect Content After an Inspection
Name:

Konferenzartikel 

Year:

2004 

Author:

T. Ragg , R. Schoknecht 

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Bibtex

@inproceedings{,
author={T. Ragg , R. Schoknecht},
title={Using Machine Learning for Estimating the Defect Content After an Inspection},
year=2004,
booktitle={IEEE Transactions on Software Engineering TSE},
url={https://ps.ipd.kit.edu/downloads/ka_2004_machine_learning_estimating_defect_content.pdf},